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Tektronix
CSA8000B and TDS8200 Sampling Oscilloscopes are comprehensive acquisition and measurement instruments for research, design evaluation and manufacturing test in the fields of datacom and telecom components, transceiver subassemblies, and transmission systems, computer and storage-based high speed electrical serial data, semiconductor test, TDR-based impedance characterization and other applications requiring bandwidths into tens of GHz.
The 8200 Series generates measurement results, not just raw data, with time and amplitude histograms, mask testing and statistical measurements. It provides a communications-tailored measurement set that includes jitter, noise, duty cycle, overshoot, undershoot, OMA, extinction ratio, Q-factor, mean optical power, and amplitude measurements for both RZ and NRZ signals. Compliance-based mask testing of high speed optical and electrical communications, and computer standards such as SDH/SONET, Ethernet, Fibre Channel is included. Color-grading and gray-scale grading of waveform data adds a third dimension, sample density, to signal acquisition and analyses. The industry’s first variable persistence database allows exact data and measurement aging on all of the functions, and facilitates dynamic update on DUTs under adjustment.
The 8200 Series combines very low timebase jitter with very fast acquisition rate. It can acquire the data in several time windows, each with its own acquisition parameters and display window. It provides a comprehensive suite of measurement capabilities to evaluate the data, as well as acquisition math and waveform math functionality to further process the results with histograms, mask testing and statistics.
The 8200 Series provides great data storage flexibility with four 3D databases available simultaneously; the databases offer an industry-first variable persistence with accurate data aging. Color-grading of waveform data adds a third dimension, sample density, to signal acquisitions and analyses.
The CSA8200 and TDS8200 models share the same capabilities; either model, for example, may be configured with any combination of sampling modules.
